Micro Materials Center Berlin
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T8 - Lead-free solder performance: Characterization, failure prediction, and industrial application

Tutorial title:

Lead-free solder performance: Characterization, failure prediction, and industrial application

Organizer:

Rainer Dudek (Fraunhofer IZM, Chemnitz),

Instructors:

Rainer Dudek (Fraunhofer IZM, Chemnitz), Steffen Wiese (TU Dresden), and Sven Rzepka (Qimonda Dresden GmbH & Co OHG)

Importance of topic

Reliability issues have become a major concern in the process of lead-free solder materials introduction into industrial practice, particularly in demanding applications. To achieve competitive product developments and manufacturing processes, it is essential to apply effective methods for reliability assessment, e.g. based on Finite Element Analysis (FEA). Successful implementation of these methods also in packaging applications using lead-free solder materials require a profound knowledge in lead-free solder bulk and joint materials characteristics, mechanical properties, and fatigue life prediction as well as dynamic loading evaluation strategies, which are provided in the course. Reference will be made to conventional SnPb, 1st generation and 2nd generation SAC solders.

Aim of course

This Workshop will provide updated knowledge on lead-free solder materials and reliability performance (A Design For Reliability (DFR) methodology employing solder materials testing, modeling, non-linear finite element analysis and fatigue life prediction will be presented along side experimental reliability test results. Finite element analysis (FEA) modeling of board level solder joint reliability assessments for several lead-free and tin-lead materials will be presented. FEA modeling for related reliability issues in packaging will be additionally discussed.

Who should attend

Design, quality and reliability professionals who are responsible for quality and reliability implementing lead-free electronic packaging and electronic assemblies.

Outline

SurveyIntroduction

  • Risk Assessment
    (What are the typical risks for manufacturability and reliability of electronic components and modules?)
  • FEA DFR strategies for BGA modules
    (How can FEA help optimizing the design of BGA modules for extended 2nd level lifetime?)
  • Evaluation of mechanical tests
    (How comparable
    are the results of mechanical tests done in industry today?)

Material Models

  • Overview on electronic polymeric and metallic materials
  • Accuracy of Material Models
    (Difficulties and pitfalls in setting up an appropriate material model)
  • Basics of Deformation of Metals
    (Dislocation glide, dislocation climb, flux of vacancies, grain boundary sliding – Why metal physics understanding helps to set up constitutive models for FEM simulation?)
  • Scaling Effects
    (Why small structures and bulk material behave differently?
    Experimental ways to characterize small structure behaviour)

Failure

  • Life prediction models - Strain-based relations (accumulated creep strain), Energy-based relations (average viscoplastic strain energy dissipated).
  • FEA modeling and simulation of Thermal Cycling Tests
  • Parametric studies on the effects of design parameters on the fatigue life of FCOB with and without underfills, CSPs and BGAs
  • Comparison between simulation results and experimental results.
About the instructors Dr. Sven Rzepka received M.S. (Dipl.-Ing.), Ph.D. (Dr.-Ing.), and Habilitation degrees in electrical engineering from Dresden University of Technology (TUD), Germany , in 1988, 1992, and 2003, respectively. After being a research associate at that university for 10 years, he joined the Memory Products part of Infineon Technologies Dresden in 2002, which split-off as Qimonda Dresden in 2006. Currently, he is senior staff engineer in the Packaging Technology department leading the FEM simulation group.
Dr. Rzepka has published more than 40 technical papers on this subject and teaches a graduate course on FEM at TU Dresden.
Dr. Steffen Wiese (*1970) studied electrical engineering at TU Dresden from 1990 to 1995. From 1995 to 1999 he took part in a PhD program at the DFG doctoral school of Sensorics, where he worked on the experimental determination of the constitutive behaviour of SnPb37 flip chip solder interconnects for FEM material models. His studies included investigations on flip chip technology, solders, creep, fatigue and life time predictions. He received the PhD degree from TU Dresden in 2000. From 1999 to 2003 he worked as a research scientist at the Semiconductor and Microsystems Laboratory of TU Dresden. Since 2003 he has been with the Electronics Packaging Laboratory of TU Dresden, where he is a senior scientist in the board level reliability research group. Dr. Rainer Dudek received the Ph.D. degree in mechanical engineering from the University of Technology Chemnitz, Germany, in 1986. From 1986 to 1993, he was with the Institute for Mechanics, Department of Fracture and Micromechanics, Chemnitz. He joined the Fraunhofer Institute for Reliability and Microintegration (IZM), Berlin in 1993. He has been working on nonlinear finite element analysis with respect to different advanced material applications since 1980. His current research interests are in the area of design-for-reliability of electronic packages, with emphasis on constitutive modeling and failure prediction for electronic materials.
Dr. Dudek is a member of the conference committees of the international ESIME, EPTC, Polytronic and ITherm conferences. He has authored and co-authored many technical publications at international journals and conferences.

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