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T8 - Lead-free solder performance: Characterization, failure prediction, and industrial application
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Tutorial title: |
Lead-free
solder performance: Characterization, failure prediction, and industrial
application |
Organizer: |
Rainer Dudek (Fraunhofer IZM,
Chemnitz), |
Instructors: |
Rainer Dudek (Fraunhofer IZM,
Chemnitz), Steffen Wiese (TU Dresden), and Sven Rzepka (Qimonda Dresden GmbH
& Co OHG) |
Importance of topic |
Reliability issues have become a major concern in
the process of lead-free solder materials introduction into industrial
practice, particularly in demanding applications. To achieve competitive
product developments and manufacturing processes, it is essential to apply
effective methods for reliability assessment, e.g. based on Finite Element
Analysis (FEA). Successful implementation of these methods also in packaging
applications using lead-free solder materials require a profound knowledge in
lead-free solder bulk and joint materials characteristics, mechanical
properties, and fatigue life prediction as well as dynamic loading evaluation
strategies, which are provided in the course. Reference will be made to conventional SnPb, 1st
generation and 2nd generation SAC solders. |
Aim of course |
This Workshop will provide updated knowledge on
lead-free solder materials and reliability performance (A Design For
Reliability (DFR) methodology employing solder materials testing, modeling, non-linear finite element analysis and fatigue
life prediction will be presented along side experimental reliability test
results. Finite element analysis (FEA) modeling of
board level solder joint reliability assessments for several lead-free and
tin-lead materials will be presented. FEA modeling for related reliability issues in packaging will be additionally discussed. |
Who should attend |
Design, quality and reliability professionals who
are responsible for quality and reliability implementing lead-free electronic
packaging and electronic assemblies. |
Outline |
Survey – Introduction
- Risk Assessment
(What are the typical risks for manufacturability and reliability of
electronic components and modules?)
- FEA DFR strategies for BGA modules
(How can FEA help optimizing the design of BGA modules for extended 2nd level
lifetime?)
- Evaluation of mechanical tests
(How comparable are
the results of mechanical tests done in industry today?)
Material Models
- Overview on electronic
polymeric and metallic materials
- Accuracy of Material
Models
(Difficulties and pitfalls in setting up an appropriate material model)
- Basics of Deformation
of Metals
(Dislocation glide, dislocation climb, flux of vacancies, grain boundary
sliding – Why metal physics understanding helps to set up constitutive models
for FEM simulation?)
- Scaling Effects
(Why small structures and bulk material behave differently?
Experimental ways to characterize small structure behaviour)
Failure
- Life prediction models - Strain-based relations
(accumulated creep strain), Energy-based relations (average viscoplastic strain energy dissipated).
- FEA modeling and
simulation of Thermal Cycling Tests
- Parametric studies on the effects of design
parameters on the fatigue life of FCOB with and without underfills, CSPs and BGAs
- Comparison between simulation results and
experimental results.
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| About the instructors |
Dr.
Sven Rzepka received M.S. (Dipl.-Ing.),
Ph.D. (Dr.-Ing.), and Habilitation degrees in electrical engineering from
Dresden
University of Technology (TUD),
Germany
, in
1988, 1992, and 2003, respectively. After being a research associate at that university for 10 years, he
joined the Memory Products part of Infineon Technologies
Dresden in 2002, which split-off as Qimonda Dresden in 2006. Currently, he is senior staff engineer in the Packaging Technology
department leading the FEM simulation group.
Dr. Rzepka has published more than 40 technical
papers on this subject and teaches a graduate course on FEM at TU
Dresden. Dr. Steffen Wiese (*1970) studied
electrical engineering at TU Dresden from 1990 to 1995. From 1995 to 1999 he
took part in a PhD program at the DFG doctoral
school of Sensorics, where he worked
on the experimental determination of the constitutive behaviour of SnPb37
flip chip solder interconnects for FEM material models. His studies included
investigations on flip chip technology, solders, creep,
fatigue and life time predictions. He received the PhD degree from TU Dresden
in 2000. From 1999 to 2003 he worked as a research scientist at the
Semiconductor and Microsystems Laboratory of TU Dresden. Since 2003 he has
been with the Electronics Packaging Laboratory of TU Dresden, where he is a
senior scientist in the board level reliability research group. Dr. Rainer Dudek received the Ph.D. degree in mechanical engineering from the University of Technology Chemnitz, Germany, in 1986. From 1986 to
1993, he was with the Institute for Mechanics, Department of Fracture and
Micromechanics,
Chemnitz. He joined the Fraunhofer Institute for Reliability and Microintegration (IZM),
Berlin in 1993. He has been working on
nonlinear finite element analysis with respect to different advanced material
applications since 1980. His current research interests are in the area of
design-for-reliability of electronic packages, with emphasis on constitutive modeling and failure prediction for electronic materials.
Dr. Dudek is a member of the conference committees
of the international ESIME, EPTC, Polytronic and ITherm conferences. He has authored and co-authored many
technical publications at international journals and conferences. |
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